Semiconductor heterostructures and device structures investigated by photoreflectance spectroscopy
نویسندگان
چکیده
In this review, we present the photoreflectance (PR) spectroscopy as a powerful tool for investigations of bulk semiconductors and semiconductor heterostructures. We discuss the application of PR technique to investigation of various properties of semiconductors, including the composition of multinary compounds, distribution of the built-in electric field and the influence of perturbations such as temperature, strain, pressure; low-dimensional structures such as quantum wells, multiple quantum wells and superlattices, quantum dots; and the structures of semiconductor devices like transistors and vertical/planar light emitting laser structures.
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